TY - GEN
AU - Althowibi, Fahad A.
AU - Ayers, John E.
TI - Characterization of Dislocations in Semiconductor Heterostructures Using X-ray Rocking Curve Pendellösung
PB - Springer Science and Business Media LLC
SN - 0361-5235
SN - 1543-186X
KW - Materials Chemistry
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2018
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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