TY - GEN
AU - Rane, Gayatri K.
AU - Menzel, Siegfried
AU - Gemming, Thomas
AU - Eckert, Jürgen
TI - Microstructure, electrical resistivity and stresses in sputter deposited W and Mo films and the influence of the interface on bilayer properties
PB - Elsevier BV
SN - 0040-6090
KW - Materials Chemistry
KW - Metals and Alloys
KW - Surfaces, Coatings and Films
KW - Surfaces and Interfaces
KW - Electronic, Optical and Magnetic Materials
PY - 2014
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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