TY - GEN
AU - Althowibi, Fahad A.
AU - Rago, Paul B.
AU - Ayers, John E.
TI - X-ray diffraction analysis for step and linearly graded InxGa1−xAs/GaAs (001) heterostructures using various hkl reflections
PB - American Vacuum Society
SN - 2166-2746
SN - 2166-2754
KW - Materials Chemistry
KW - Electrical and Electronic Engineering
KW - Surfaces, Coatings and Films
KW - Process Chemistry and Technology
KW - Instrumentation
KW - Electronic, Optical and Magnetic Materials
PY - 2016
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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