author = { Watts, Richard N. AND Ederer, David L. AND Deslattes, Jr., Richard D. AND Lucatorto, Thomas B. AND Estler, William T. AND Evans, Christopher J. AND Vorburger, Theodore V. },

title = { Upgraded facility for multilayer mirror characterization at NIST },

publisher = {SPIE},

isbn = {0277-786X},

year = {1992},

url = { http://slubdd.de/katalog?TN_libero_mab2 }