author = { Breitenstein, Otwin AND Warta, Wilhelm AND Langenkamp, Martin },

title = { Lock-in thermography basics and use for evaluating electronic devices and materials },

edition = { 2. ed. } ,

publisher = {Springer},

isbn = {9783642024160},

isbn = {9783642264788},

keywords = { Electronic apparatus and appliances Thermal properties , Electronic apparatus and appliances Testing , Semiconductors Thermal properties , Thermography , Infrarotthermographie },

year = {2010},

booktitle = {Springer series in advanced microelectronics ; 10},

address = { Berlin },

url = { http://slubdd.de/katalog?TN_libero_mab2 }