author = { Gnanachchelvi, Parameshwaran AND Wilamowski, Bogdan M. AND Jaeger, Richard C. AND Hussain, Safina AND Suhling, Jeffrey C. AND Hamilton, Michael C. },

title = { A 1D numerical model for rapid stress analysis in bipolar junction transistors },

publisher = {Wiley},

isbn = {0894-3370},

isbn = {1099-1204},

keywords = { Electrical and Electronic Engineering , Computer Science Applications , Modeling and Simulation },

year = {2016},

url = { http://slubdd.de/katalog?TN_libero_mab2 }