@misc
{TN_libero_mab2,
author = {
Ishida, Takeshi
AND
Tega, Naoki
AND
Mori, Yuki
AND
Miki, Hiroshi
AND
Mine, Toshiyuki
AND
Kume, Hitoshi
AND
Torii, Kazuyoshi
AND
Yamada, Ren-ichi
AND
Shiraishi, Kenji
},
title = {
State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO2 Films in a Metal–Oxide–Silicon Structure
},
publisher = {IOP Publishing},
isbn = {0021-4922},
isbn = {1347-4065},
keywords = {
General Physics and Astronomy
,
General Engineering
},
year = {2013},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}