TY - GEN
AU - Garg, Shelly
AU - Saurabh, Sneh
TI - Improving the Scalability of SOI-Based Tunnel FETs Using Ground Plane in Buried Oxide
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 2168-6734
KW - Electrical and Electronic Engineering
KW - Electronic, Optical and Magnetic Materials
KW - Biotechnology
PY - 2019
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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