%0 Generic
%T Improving the Scalability of SOI-Based Tunnel FETs Using Ground Plane in Buried Oxide
%A Garg, Shelly
%A Saurabh, Sneh
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 2168-6734
%K Electrical and Electronic Engineering
%K Electronic, Optical and Magnetic Materials
%K Biotechnology
%D 2019
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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