author = { Abramovici, Miron AND Breuer, Melvin A. AND Friedman, Arthur D. },

title = { Digital systems testing and testable design },

edition = { Rev. print. } ,

publisher = {IEEE Press},

isbn = {0780310624},

keywords = { Electronic circuits Testing , Digital electronics , Digitale integrierte Schaltung , Schaltungsentwurf , Prüfung , Entwurfsautomation , Test },

year = {1990},

abstract = {Includes references (p. 627-647) and index},

booktitle = {Electrical engineering, circuits and systems, computers},

address = { New York, NY },

url = { http://slubdd.de/katalog?TN_libero_mab2 }