author = { Tanaka, Atsushi AND Matsuhata, Hirofumi AND Kawabata, Naoyuki AND Mori, Daisuke AND Inoue, Kei AND Ryo, Mina AND Fujimoto, Takumi AND Tawara, Takeshi AND Miyazato, Masaki AND Miyajima, Masaaki AND Fukuda, Kenji AND Ohtsuki, Akihiro AND Kato, Tomohisa AND Tsuchida, Hidekazu AND Yonezawa, Yoshiyuki AND Kimoto, Tsunenobu },

title = { Growth of Shockley type stacking faults upon forward degradation in 4H-SiC p-i-n diodes },

publisher = {AIP Publishing},

isbn = {0021-8979},

isbn = {1089-7550},

keywords = { General Physics and Astronomy },

year = {2016},

url = { http://slubdd.de/katalog?TN_libero_mab2 }