TY - GEN
AU - Omura, Y.
AU - Izumi, K.
TI - Quantum mechanical influences on short-channel effects in ultra-thin MOSFET/SIMOX devices
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0741-3106
SN - 1558-0563
KW - Electrical and Electronic Engineering
KW - Electronic, Optical and Magnetic Materials
PY - 1996
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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