author = { Ishida, Takeshi AND Tega, Naoki AND Mori, Yuki AND Miki, Hiroshi AND Mine, Toshiyuki AND Kume, Hitoshi AND Torii, Kazuyoshi AND Yamada, Ren-ichi AND Shiraishi, Kenji },

title = { State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO2 Films in a Metal–Oxide–Silicon Structure },

publisher = {IOP Publishing},

isbn = {0021-4922},

isbn = {1347-4065},

keywords = { General Physics and Astronomy , General Engineering },

year = {2013},

url = { http://slubdd.de/katalog?TN_libero_mab2 }