%0 Generic
%T Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO2films
%A Ishida, Takeshi
%A Tega, Naoki
%A Mori, Yuki
%A Miki, Hiroshi
%A Mine, Toshiyuki
%A Kume, Hitoshi
%A Torii, Kazuyoshi
%A Yamada, Ren-ichi
%A Shiraishi, Kenji
%I IOP Publishing
%@ 0021-4922
%@ 1347-4065
%K General Physics and Astronomy
%K Physics and Astronomy (miscellaneous)
%K General Engineering
%D 2014
%C IOP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2
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