TY - GEN
AU - Ishida, Takeshi
AU - Tega, Naoki
AU - Mori, Yuki
AU - Miki, Hiroshi
AU - Mine, Toshiyuki
AU - Kume, Hitoshi
AU - Torii, Kazuyoshi
AU - Yamada, Ren-ichi
AU - Shiraishi, Kenji
TI - Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO2films
PB - IOP Publishing
SN - 0021-4922
SN - 1347-4065
KW - General Physics and Astronomy
KW - Physics and Astronomy (miscellaneous)
KW - General Engineering
PY - 2014
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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