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Zhigal'skii, G. P. [Author]; Jones, B. K. [Author] ; Žigalʹskij, G. P. [Other]; Jones, Brian K. [Other]

The physical properties of thin metal films - [1. publ.]

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London [u.a.]: Taylor & Francis, 2003

Published in: Electrocomponent science monographs ; 13
Zhigal’skii, G. P.; Kholomina, T. A.

Excess noise and deep levels in GaAs detectors of nuclear particles and ionizing radiation

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Pleiades Publishing Ltd, 2015

Published in: Journal of Communications Technology and Electronics
Zhigal'skii, G. P.; Fedorov, A. S.

1/f noise generated by equilibrium temperature fluctuations in metal films

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Springer Science and Business Media LLC, 1994

Published in: Radiophysics and Quantum Electronics
Zhigal'skii, G. P.; Fedorov, A. S.

A study of excess noise in mos structures under quasiequilibrium conditions

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Springer Science and Business Media LLC, 1991

Published in: Radiophysics and Quantum Electronics
Zhigal'skii, G. P.; Fedorov, A. S.

Effect of formation and geometric factors on flicker noise in chromium films

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Springer Science and Business Media LLC, 1985

Published in: Radiophysics and Quantum Electronics
Potemkin, V. V.; Zhigal'skii, G. P.

Noise in sinusoidally magnetized thin magnetic films

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Springer Science and Business Media LLC, 1967

Published in: Radiophysics and Quantum Electronics
Golik, R. G.; Gromov, D. G.; Zhigal’skii, G. P.

Analysis of structural transformations and fluctuation effects in the nanosized nickel films in the vicinity of the melting point

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Pleiades Publishing Ltd, 2012

Published in: Journal of Communications Technology and Electronics
Zhigal'skii, G. P.; Putrya, M. G.; Fedorov, A. S.

Effect of silicon-wafer preoxidation on the low-frequency noise of mis structures

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Springer Science and Business Media LLC, 1989

Published in: Radiophysics and Quantum Electronics
Zhigal'skii, G. P.; Kurov, G. A.; Siranashvili, I. Sh.

Excess noise and mechanical stress in thin chromium films

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Springer Science and Business Media LLC, 1983

Published in: Radiophysics and Quantum Electronics
Andrushko, A. F.; Bakshi, I. S.; Zhigal'skii, G. P.

Effects of structural factors on the 1/f noise of aluminum films

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Springer Science and Business Media LLC, 1981

Published in: Radiophysics and Quantum Electronics
Zhigal'skii, G. P.; Fedorov, A. S.; Boltnev, A. N.

Excess noise level in MOS structures without straight-through macrodefects in the dielectric

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Springer Science and Business Media LLC, 1983

Published in: Radiophysics and Quantum Electronics
Zhigal’skii, G. P.; Gvas’kov, A. A.; Sitkin, P. O.

1/f noise in metal insulator semiconductor transistors with different conductivity types and different topological dimensions of the channel

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Pleiades Publishing Ltd, 2007

Published in: Journal of Communications Technology and Electronics
Zhigal’skii, G. P.; Kostryukov, S. A.; Litvinov, V. G.; Rodin, M. S.; Kholomina, T. A.

Analysis of the parameters of deep centers in the Al/i-GaAs detectors of charged particles and X-ray radiation

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Pleiades Publishing Ltd, 2007

Published in: Journal of Communications Technology and Electronics
Zhigal'skii, G. P.; Karev, A. V.; Siranashvili, I. Sh.; Andrushko, A. F.; Kovalev, V. D.

Effects of structural factors on the flicker noise in fine-grained chromium films

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Springer Science and Business Media LLC, 1990

Published in: Radiophysics and Quantum Electronics
Gromov, D. G.; Zhigal’skii, G. P.; Karev, A. V.; Karev, I. A.; Chulkov, I. S.; Shmelev, S. S.

Fluctuation phenomena in nanoscale nickel films near the melting point

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Pleiades Publishing Ltd, 2011

Published in: Semiconductors
Bespalov, V. A.; Vorontsov, A. V.; Gorbatsevich, A. A.; Egorkin, V. I.; Zhigal’skii, G. P.; Il’ichev, É. A.; Kulakov, A. V.; Nalbandov, B. G.; Pantuev, V. S.; Rasputnyi, V. N.; Sveshnikov, Yu. N.; Shmelev, S. S.

Electrophysical properties of GaAs layers and the characteristics of fast particle GaAs detectors

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Pleiades Publishing Ltd, 2004

Published in: Technical Physics

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