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  1. Ebling, Dirk G.; Eiche, Clemens; Fiederle, Michael; Joerger, Wolfgang; Laasch, M.; Salk, Manfred; Schwarz, Ralf; Benz, Klaus-Werner

    Resistivity and deep-level investigations of detector-grade CdTe: a comparison of different growth techniques

    Conference Proceedings
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    SPIE, 1995

    Published in: SPIE Proceedings