Media type: E-Article Title: Muller C-Element Exploiting Programmable Metallization Cell for Bayesian Inference Contributor: Kaur, Jasmine; Saurabh, Sneh; Sahay, Shubham imprint: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Journal on Emerging and Selected Topics in Circuits and Systems Language: Not determined DOI: 10.1109/jetcas.2022.3206479 ISSN: 2156-3357; 2156-3365 Keywords: Electrical and Electronic Engineering Origination: Footnote: