Media type: E-Article Title: Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From ${-}150\,^{\circ}$C to ${+}125\,^{\circ}$C Contributor: Cho, Chun-Hyung; Jaeger, Richard C.; Suhling, Jeffrey C. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2008 Published in: IEEE Sensors Journal Language: Not determined DOI: 10.1109/jsen.2008.923575 ISSN: 1530-437X Keywords: Electrical and Electronic Engineering ; Instrumentation Origination: Footnote: