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Medientyp:
Buch
Titel:
Advances in speckle metrology and related techniques
Enthält:
Radial Speckle Interferometry and Applications
/ Armando Albertazzi Gonçalves, Matías R Viotti
Depth-Resolved Displacement Field Measurement
/ Jonathan M Huntley, Pablo D Ruiz
Single-Image Interferogram Demodulation
/ Manuel Servin, Julio Estrada, Antonio Quiroga
Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods
/ Alejandro Federico, Guillermo H Kaufmann
Optical Vortex Metrology
/ Wei Wang, Steen G Hanson, Mitsuo Takeda
Speckle Coding for Optical and Digital Data Security Applications
/ Arvind Kumar, Madan Singh, Kehar Singh.