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Seidel, Falko; Fronk, Michael; Himcinschi, Cameliu; Chis, Vasile; Zahn, Dietrich R. T.

Spectroscopic ellipsometry and reflection anisotropy spectroscopy of lutetium diphthalocyanine films on silicon

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  • Medientyp: E-Artikel
  • Titel: Spectroscopic ellipsometry and reflection anisotropy spectroscopy of lutetium diphthalocyanine films on silicon
  • Beteiligte: Seidel, Falko; Fronk, Michael; Himcinschi, Cameliu; Chis, Vasile; Zahn, Dietrich R. T.
  • Erschienen: Wiley, 2010
  • Erschienen in: physica status solidi c
  • Sprache: Englisch
  • DOI: 10.1002/pssc.200982464
  • ISSN: 1862-6351; 1610-1642
  • Schlagwörter: Condensed Matter Physics
  • Entstehung:
  • Anmerkungen:
  • Beschreibung: <jats:title>Abstract</jats:title><jats:p>The main aim of this work is to investigate organic thin films by the use of Reflection Anisotropy Spectroscopy (RAS) and Spectroscopic Ellipsometry (SE) <jats:italic>in situ</jats:italic> during growth of the thin films on silicon substrates. The investigated material is the rare‐earth diphthalocyanine LuPc<jats:sub>2</jats:sub>. The LuPc<jats:sub>2</jats:sub> films were deposited on hydrogen passtivated Si(111) and on oxidised Si substrates by Organic Molecular Beam Deposition (OMBD). The films on H‐Si(111) show a high anisotropic behaviour. Model calculations for <jats:italic>in situ</jats:italic> SE measurements revealed angles between <jats:italic>θ</jats:italic> = 60° and 90° for LuPc<jats:sub>2</jats:sub> on H‐Si(111). Furthermore, the energy transitions found match to those determined by Density Functional Theory calculations (DFT). (© 2010 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</jats:p>