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Medientyp:
E-Artikel
Titel:
Fast STEM Spectrum Imaging Using Simultaneous EELS and EDS
Beteiligte:
Longo, Paolo;
Twesten, Ray D
Erschienen:
Oxford University Press (OUP), 2013
Erschienen in:Microscopy Today
Sprache:
Englisch
DOI:
10.1017/s1551929512000909
ISSN:
1551-9295;
2150-3583
Entstehung:
Anmerkungen:
Beschreibung:
<jats:p>Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. They might choose energy dispersive X-ray spectroscopy (EDS) analysis when working with thick samples containing high-Z elements or choose electron energy-loss spectroscopy (EELS) when studying low-Z materials in thin samples. With the advent of STEM instruments possessing both high-mechanical stability and high-brightness probes, coupled with the latest generation of fast, efficient X-ray and EELS detectors, choosing between complementary techniques is a significant restriction. The acquisition systems available up to now have forced a choice because EELS, EDS, and fast scanning have not been designed to work together, resulting in inefficient data collection.</jats:p>