Sekanina, Lukáš
[Other]
;
IEEE Computer Society,
IEEE Computer Society Test Technology Technical Council
IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013
: 8 - 10 April 2013, Karlovy Vary, Czech Republic
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Media type:
E-Book;
Conference Proceedings
Title:
IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013
:
8 - 10 April 2013, Karlovy Vary, Czech Republic
Other titles:
Nebent.: Proceedings of the IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)