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Gerken, Beeke [VerfasserIn]; Mahr, Christoph [VerfasserIn]; Stahl, Jakob [VerfasserIn]; Griebel, Tim [VerfasserIn]; Schowalter, Marco [VerfasserIn]; Krause, Florian Fritz [VerfasserIn]; Mahrtens, Thorsten [VerfasserIn]; Mädler, Lutz [VerfasserIn]; Rosenauer, Andreas [VerfasserIn]

Material discrimination in nanoparticle hetero-aggregates by analysis of scanning transmission electron microscopy images

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  • Medientyp: E-Artikel
  • Titel: Material discrimination in nanoparticle hetero-aggregates by analysis of scanning transmission electron microscopy images
  • Beteiligte: Gerken, Beeke [VerfasserIn]; Mahr, Christoph [VerfasserIn]; Stahl, Jakob [VerfasserIn]; Griebel, Tim [VerfasserIn]; Schowalter, Marco [VerfasserIn]; Krause, Florian Fritz [VerfasserIn]; Mahrtens, Thorsten [VerfasserIn]; Mädler, Lutz [VerfasserIn]; Rosenauer, Andreas [VerfasserIn]
  • Erschienen: May 2023
  • Erschienen in: Particle & particle systems characterization ; 40(2023), 9, Artikel-ID 2300048, Seite 1-8
  • Sprache: Englisch
  • DOI: 10.1002/ppsc.202300048
  • ISSN: 1521-4117
  • Identifikator:
  • Entstehung:
  • Anmerkungen: First published 5 May 2023
  • Beschreibung: Hetero-contacts are interfaces between different materials at the nanoscale leading to novel functional properties. In hetero-aggregates, primary particles of at least two different materials are mixed at primary particle or cluster level. Double flame spray pyrolysis (DFSP) is a versatile technique for the controlled synthesis of such materials. Characterization of hetero-aggregates by scanning transmission electron microscopy (STEM) requires acquisition and evaluation of many aggregate images in order to derive statistically significant results. Usually, STEM energy dispersive X-ray spectroscopy (EDXS) is used to acquire elemental maps providing the material distribution of the primary particles within hetero-aggregates. However, the acquisition of a single EDXS map takes up to several minutes. For this reason, determination of material types of primary particles from the intensity in high-angle annular dark field STEM images alone is desirable. These images can be acquired within a couple of seconds. In the present work, a method is suggested which allows for achieving this objective. It can be applied to distinguish materials with a significant difference in their atomic number and hence sufficient material contrast in the STEM images.
  • Zugangsstatus: Freier Zugang