Erschienen:
International Union of Crystallography (IUCr), 2015
Erschienen in:Journal of Applied Crystallography
Sprache:
Nicht zu entscheiden
DOI:
10.1107/s1600576715020440
ISSN:
1600-5767
Entstehung:
Anmerkungen:
Beschreibung:
<jats:p>Low-energy contamination caused by focusing multilayer optics has been known for a long time. So far, the only method to avoid this problem is attenuation by interposition of a low-density material foil into the beam. However, attenuation lowers the intensity, which might be crucial, especially for charge density data collection, and is of course not possible for already measured data. In this article, an empirical correction is proposed as an alternative or addition. The low-energy contamination mainly affects the reflections with indices 3<jats:italic>h</jats:italic>3<jats:italic>k</jats:italic>3<jats:italic>l</jats:italic>. In the program<jats:italic>SADABS</jats:italic>, a 3λ correction in analogy to the earlier 2/λ correction is now implemented. The correction factor can be determined from the model, but for most cases, a default value depending on the experimental settings is acceptable. Alternatively, the correction can be refined in<jats:italic>SHELXL</jats:italic>, similarly to a twin refinement. An investigation of several data sets collected with and without attenuation revealed that the empirical correction and attenuation lead to similar improvements. The empirical correction is of special interest for charge density investigations, where the loss of intensity could hinder the data collection up to very high resolution. Here, the improvements in the model, especially for the noise level of the residual density, are even more pronounced.</jats:p>