Media type: Book Title: Introduction to spectroscopic ellipsometry of thin film materials : instrumentation, data analysis, and applications Contributor: Wee, Andrew T. S. [VerfasserIn]; Yin, Xinmao [VerfasserIn]; Tang, Chi Sin [VerfasserIn] Corporation: Wiley-VCH imprint: Weinheim: Wiley-VCH, [2022] Extent: x, 187 Seiten; Illustrationen; 24.4 cm x 17 cm Language: English ISBN: 9783527349517; 3527349510 Publisher, production or purchase order numbers: Sonstige Nummer: 1134951 000 RVK notation: UP 7500 : Allgemeines Keywords: Ellipsometrie > Dünne Schicht Origination: Footnote: