Media type: E-Article Title: Mechanism of state transition of a defect causing random-telegraph-noise-induced fluctuation in stress-induced leakage current of SiO2films Contributor: Ishida, Takeshi; Tega, Naoki; Mori, Yuki; Miki, Hiroshi; Mine, Toshiyuki; Kume, Hitoshi; Torii, Kazuyoshi; Yamada, Ren-ichi; Shiraishi, Kenji imprint: IOP Publishing, 2014 Published in: Japanese Journal of Applied Physics Language: Not determined DOI: 10.7567/jjap.53.08lb01 ISSN: 0021-4922; 1347-4065 Keywords: General Physics and Astronomy ; Physics and Astronomy (miscellaneous) ; General Engineering Origination: Footnote: